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Future of Low-Power Chips in Doubt
Friday, August 07, 2009 - Anuradha Menon
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Engineers at the U.S. National Institute of Standards and Technology (NIST) say that the basic theory explaining the origin of a certain type of noise produced by very small transistors is totally wrong. Known as random telegraph noise, this aberrant signal is becoming a problem for static RAM and flash memory, and it will also become a threat to future low-power logic circuits as their dimensions continue to shrink and the voltage at which they operate decreases.    (source: spectrum.ieee.org)


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